Visitors can also look at nanoparticle characterization with the Zetasizer Nano and NanoSight Nanoparticle Tracking Analysis (NTA) systems, and morphological and chemical characterization with the Morphologi G3-ID, also the subject of a conference presentation.
As well as exhibiting, Malvern is also contributing five short courses, covering topics that include particle and nanoparticle size analysis, gel permeation/size exclusion chromatography, optical rheology and zeta potential measurement. In addition, work using Malvern’s Morphologi G3-ID particle characterization system will be described in “Forensic Analyses by Morphologically Directed Raman Spectroscopy”, a presentation from researchers at the University of New Haven, which forms part of the conference session ”Techniques in Forensic Analysis”.
